test Browse by Author Names Browse by Titles of Works Browse by Subjects of Works Browse by Issue Dates of Works
       

Advanced Search
Home   
 
Browse   
Communities
& Collections
  
Issue Date   
Author   
Title   
Subject   
 
Sign on to:   
Receive email
updates
  
My Account
authorized users
  
Edit Profile   
 
Help   
About T-Space   

T-Space at The University of Toronto Libraries >
Faculty of Applied Science and Engineering >
The Edward S. Rogers Sr. Department of Electrical & Computer Engineering >
The Edward S. Rogers Sr. Department of Electrical and Computer Engineering >

Please use this identifier to cite or link to this item: http://hdl.handle.net/1807/10044

Title: De-embedding transmission line measurements for accurate modeling of IC designs
Authors: Voinigescu, Sorin
Mangan, Alain M.
Yang, Ming-Ta
Tazlauanu, Mihai
Issue Date: 2006
Publisher: IEEE
Citation: S. Voinigescu, A. M. Mangan, M. Yang, M. Tazlauanu, 'De-embedding transmission line measurements for accurate modeling of IC designs', IEEE Transactions on Electron Devices, vol.53, no.2, pp.235-241, 2006
URI: http://ieeexplore.ieee.org/
http://hdl.handle.net/1807/10044
Rights: ©2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Appears in Collections:The Edward S. Rogers Sr. Department of Electrical and Computer Engineering

Files in This Item:

File Description SizeFormat
Voinigescu_11437_2523.pdf847.96 kBAdobe PDF
View/Open

Items in T-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

uoft